The TS 740 infrared touch probe provides a probing accuracy of≤ ± 1 µm and a repeatability factor of 2 ƒã ≤ 0.25 µm. The probe features a new sensor; the new technology involves the use of three sensor elements. When probing a workpiece, the stylus is deflected so that a force acts on the elements. This results in the generation of charges that are detected by the electronics and converted into trigger signals. The unit is designed for use in modern machine tools with a fast tool changer, and rapid acceleration or deceleration does not cause uncontrolled trigger signals.

Heidenhain Corp.

www.heidenhain.us

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